DocumentCode :
2992051
Title :
Characterization and reduction of number dependent sensitivity in multi-pole linear ion trap standards
Author :
Burt, E.A. ; Tjoelker, R.L.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA
fYear :
2005
fDate :
29-31 Aug. 2005
Firstpage :
466
Lastpage :
471
Abstract :
The multipole linear ion trap standard developed at the Jet propulsion laboratory has demonstrated excellent short and long-term stability and improved immunity from two of its remaining systematic effects, the second order Doppler shift and second order Zeeman shift. The technology has also demonstrated long-term operation in the field. In this paper, we discuss the LITS systematic effects and present the characterization and reduction of the primary shifts and their dependence on ion number
Keywords :
Doppler shift; Zeeman effect; numerical analysis; particle traps; Doppler shift; LITS systematic effects; Zeeman shift; linear ion trap standard; long-term stability; multipole ion trap standard; number dependent sensitivity; short stability; Atomic clocks; Doppler shift; Frequency; Helium; Laboratories; Magnetic field measurement; Mercury (metals); Propulsion; Stability; Standards development;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium and Exposition, 2005. Proceedings of the 2005 IEEE International
Conference_Location :
Vancouver, BC
Print_ISBN :
0-7803-9053-9
Type :
conf
DOI :
10.1109/FREQ.2005.1573975
Filename :
1573975
Link To Document :
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