• DocumentCode
    2992051
  • Title

    Characterization and reduction of number dependent sensitivity in multi-pole linear ion trap standards

  • Author

    Burt, E.A. ; Tjoelker, R.L.

  • Author_Institution
    Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA
  • fYear
    2005
  • fDate
    29-31 Aug. 2005
  • Firstpage
    466
  • Lastpage
    471
  • Abstract
    The multipole linear ion trap standard developed at the Jet propulsion laboratory has demonstrated excellent short and long-term stability and improved immunity from two of its remaining systematic effects, the second order Doppler shift and second order Zeeman shift. The technology has also demonstrated long-term operation in the field. In this paper, we discuss the LITS systematic effects and present the characterization and reduction of the primary shifts and their dependence on ion number
  • Keywords
    Doppler shift; Zeeman effect; numerical analysis; particle traps; Doppler shift; LITS systematic effects; Zeeman shift; linear ion trap standard; long-term stability; multipole ion trap standard; number dependent sensitivity; short stability; Atomic clocks; Doppler shift; Frequency; Helium; Laboratories; Magnetic field measurement; Mercury (metals); Propulsion; Stability; Standards development;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium and Exposition, 2005. Proceedings of the 2005 IEEE International
  • Conference_Location
    Vancouver, BC
  • Print_ISBN
    0-7803-9053-9
  • Type

    conf

  • DOI
    10.1109/FREQ.2005.1573975
  • Filename
    1573975