DocumentCode
2992051
Title
Characterization and reduction of number dependent sensitivity in multi-pole linear ion trap standards
Author
Burt, E.A. ; Tjoelker, R.L.
Author_Institution
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA
fYear
2005
fDate
29-31 Aug. 2005
Firstpage
466
Lastpage
471
Abstract
The multipole linear ion trap standard developed at the Jet propulsion laboratory has demonstrated excellent short and long-term stability and improved immunity from two of its remaining systematic effects, the second order Doppler shift and second order Zeeman shift. The technology has also demonstrated long-term operation in the field. In this paper, we discuss the LITS systematic effects and present the characterization and reduction of the primary shifts and their dependence on ion number
Keywords
Doppler shift; Zeeman effect; numerical analysis; particle traps; Doppler shift; LITS systematic effects; Zeeman shift; linear ion trap standard; long-term stability; multipole ion trap standard; number dependent sensitivity; short stability; Atomic clocks; Doppler shift; Frequency; Helium; Laboratories; Magnetic field measurement; Mercury (metals); Propulsion; Stability; Standards development;
fLanguage
English
Publisher
ieee
Conference_Titel
Frequency Control Symposium and Exposition, 2005. Proceedings of the 2005 IEEE International
Conference_Location
Vancouver, BC
Print_ISBN
0-7803-9053-9
Type
conf
DOI
10.1109/FREQ.2005.1573975
Filename
1573975
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