DocumentCode :
2992109
Title :
Super heavy 6.0 mils Cu wire ball bonding
Author :
Tan Poh Chai ; Joe Tan ; Sivakumar, M. ; Premkumar, J. ; James Song ; Wong, Y. M.
Author_Institution :
ASM Technology Singapore, 2 Yishun Avenue, Singapore 768924
fYear :
2008
fDate :
4-6 Nov. 2008
Firstpage :
1
Lastpage :
5
Abstract :
The quest to replace wire material from gold (Au) to Copper (Cu) in wire bonding interconnect has been in the industry since few decades. As the Cu wire bonding manufacturing process matures, the idea of substituting Al wedge bond with Cu ball bond is mooted. Such substitution could potentially reap benefits of lower machine cost of ownership and better utilization of silicon real estate. It also comes with better conductivity, slower intermetallic growth and possibly cheaper material price. However, the associated challenges such as hardness and oxidation could be overwhelming and requires a careful assessment. The objective of this study is to provide insight of the 6.0 mils Cu wire bonding process. 6.0 mils Cu wire is the key candidate in this Al - Cu wire substitution idea. Bonding interaction of Cu wire, chip & lead are studied experimentally.
Keywords :
Bonding; Conductivity; Copper; Costs; Gold; Manufacturing industries; Manufacturing processes; Metals industry; Silicon; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Manufacturing Technology Symposium (IEMT), 2008 33rd IEEE/CPMT International
Conference_Location :
Penang, Malaysia
ISSN :
1089-8190
Print_ISBN :
978-1-4244-3392-6
Electronic_ISBN :
1089-8190
Type :
conf
DOI :
10.1109/IEMT.2008.5507778
Filename :
5507778
Link To Document :
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