Title :
High resolution measurement of polarization mode dispersion with quantum interferometry
Author :
Fraine, A.M. ; Egorov, R. ; Simon, D.S. ; Minaeva, O.V. ; Sergienko, A.V.
Author_Institution :
Dept. of Electr. & Comput. Eng., Boston Univ., Boston, MA, USA
Abstract :
A new quantum interferometric technique for measuring polarization mode dispersion with a higher precision than classical techniques is introduced. This approach simultaneously allows extracting chromatic and polarization mode dispersion parameters from a single optical setup.
Keywords :
light interferometry; optical dispersion; optical variables measurement; quantum optics; chromatic parameters extraction; high resolution measurement; polarization mode dispersion parameters extraction; quantum interferometry; Dispersion; Distortion measurement; Optical distortion; Optical interferometry; Optical polarization; Optical variables measurement; Polarization mode dispersion;
Conference_Titel :
Photonics Society Summer Topical Meeting Series, 2011 IEEE
Conference_Location :
Montreal, QC
Print_ISBN :
978-1-4244-5730-4
DOI :
10.1109/PHOSST.2011.6000030
