• DocumentCode
    2992141
  • Title

    High resolution measurement of polarization mode dispersion with quantum interferometry

  • Author

    Fraine, A.M. ; Egorov, R. ; Simon, D.S. ; Minaeva, O.V. ; Sergienko, A.V.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Boston Univ., Boston, MA, USA
  • fYear
    2011
  • fDate
    18-20 July 2011
  • Firstpage
    33
  • Lastpage
    34
  • Abstract
    A new quantum interferometric technique for measuring polarization mode dispersion with a higher precision than classical techniques is introduced. This approach simultaneously allows extracting chromatic and polarization mode dispersion parameters from a single optical setup.
  • Keywords
    light interferometry; optical dispersion; optical variables measurement; quantum optics; chromatic parameters extraction; high resolution measurement; polarization mode dispersion parameters extraction; quantum interferometry; Dispersion; Distortion measurement; Optical distortion; Optical interferometry; Optical polarization; Optical variables measurement; Polarization mode dispersion;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photonics Society Summer Topical Meeting Series, 2011 IEEE
  • Conference_Location
    Montreal, QC
  • ISSN
    Pending
  • Print_ISBN
    978-1-4244-5730-4
  • Type

    conf

  • DOI
    10.1109/PHOSST.2011.6000030
  • Filename
    6000030
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2992141