Title :
Fault orientated test and fault simulation of mixed signal integrated circuits
Author :
Bell, Ian M. ; Eckersall, Kevin R. ; Spinks, Stephen J. ; Taylor, Gaynor E.
Author_Institution :
Dept. of Electron. Eng., Hull Univ., UK
fDate :
30 Apr-3 May 1995
Abstract :
This paper considers the implications of structural test for analog and mixed signal (analog and digital) circuits and describes fault simulation software suitable for investigating a variety of test methods. Results from simulation investigations of dynamic supply current test are presented and compared with results obtained for real circuits. In both cases the results indicate increased fault coverage and reliability benefits. The dynamic supply current monitoring equipment used to implement the hardware test is described
Keywords :
automatic test equipment; automatic testing; circuit analysis computing; electric current measurement; fault diagnosis; integrated circuit testing; mixed analogue-digital integrated circuits; monitoring; ASIC testing; analog ICs; current monitoring equipment; dynamic supply current test; fault coverage; fault orientated testing; fault simulation software; hardware test; mixed signal integrated circuits; reliability; structural test; Analog circuits; Application specific integrated circuits; Circuit faults; Circuit simulation; Circuit testing; Current measurement; Current supplies; Integrated circuit testing; Mixed analog digital integrated circuits; Software testing;
Conference_Titel :
Circuits and Systems, 1995. ISCAS '95., 1995 IEEE International Symposium on
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-2570-2
DOI :
10.1109/ISCAS.1995.521532
