DocumentCode
2992280
Title
Proceedings. 22nd IEEE VLSI Test Symposium
fYear
2004
fDate
25-29 April 2004
Abstract
Presents the cover from the proceedings of this conference.
Keywords
VLSI; built-in self test; embedded systems; fault simulation; field programmable gate arrays; integrated circuit testing; integrated memory circuits; logic testing; micromechanical devices; system-on-chip; 3D packaging; ATE; FPGA testing; International Technology Roadmap for Semiconductor; MEMS testing; SoC test; VLSI test; analog circuit testing; automatic test equipment; defect analysis; defect testing; delay testing; embedded memory diagnosis; embedded memory test; fault simulation; field programmable gate array testing; logic built-in self test; manufacturing process; memory systems; memory testing; microelectromechanical system; nanocircuits testing; pattern debug; production testing; reliability; silicon debug; silicon diagnosis; system-on-chip test; test data compression; thermal testing; very large scale integration test; wafer probe test; wireless testing; yield analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2004. Proceedings. 22nd IEEE
Conference_Location
Napa Valley, CA, USA
ISSN
1093-0167
Print_ISBN
0-7695-2134-7
Type
conf
DOI
10.1109/VTEST.2004.1299199
Filename
1299199
Link To Document