مرکز منطقه ای اطلاع رساني علوم و فناوري - Proceedings. 22nd IEEE VLSI Test Symposium

Keywords :

VLSI; built-in self test; embedded systems; fault simulation; field programmable gate arrays; integrated circuit testing; integrated memory circuits; logic testing; micromechanical devices; system-on-chip; 3D packaging; ATE; FPGA testing; International Technology Roadmap for Semiconductor; MEMS testing; SoC test; VLSI test; analog circuit testing; automatic test equipment; defect analysis; defect testing; delay testing; embedded memory diagnosis; embedded memory test; fault simulation; field programmable gate array testing; logic built-in self test; manufacturing process; memory systems; memory testing; microelectromechanical system; nanocircuits testing; pattern debug; production testing; reliability; silicon debug; silicon diagnosis; system-on-chip test; test data compression; thermal testing; very large scale integration test; wafer probe test; wireless testing; yield analysis;