Title :
Circuit Debug using Time Resolved Emission (TRE) Prober - A Case Study
Author :
Wong, Houn Wai ; Low, Pit Fuh ; Wong, Vee Kin
Author_Institution :
Intel Microelectron. (M) Sdn. Bhd., Bayan Lepas
fDate :
Oct. 29 2006-Dec. 1 2006
Abstract :
Time resolved emission microscopy (TRE) is a revolutionary tool used in advanced microprocessors silicon debug. Unlike other debug tools, the interpretation of TRE data may not be straightforward and can sometimes be misleading. In this paper we show through a case study why this is true. Interpretation of TRE data should be done carefully with good knowledge on device emission physics, circuit behavior and creative fault analysis.
Keywords :
fault diagnosis; integrated circuit testing; microprocessor chips; silicon; time resolved spectroscopy; circuit behavior; circuit debug; creative fault analysis; device emission physics; microprocessors silicon debug; time resolved emission microscopy; time resolved emission prober; Circuits; Data mining; Energy states; Laser theory; Microprocessors; Microscopy; Probes; Silicon; Timing; Voltage;
Conference_Titel :
Semiconductor Electronics, 2006. ICSE '06. IEEE International Conference on
Conference_Location :
Kuala Lumpur
Print_ISBN :
0-7803-9730-4
Electronic_ISBN :
0-7803-9731-2
DOI :
10.1109/SMELEC.2006.380711
