DocumentCode
2992297
Title
Circuit Debug using Time Resolved Emission (TRE) Prober - A Case Study
Author
Wong, Houn Wai ; Low, Pit Fuh ; Wong, Vee Kin
Author_Institution
Intel Microelectron. (M) Sdn. Bhd., Bayan Lepas
fYear
2006
fDate
Oct. 29 2006-Dec. 1 2006
Firstpage
637
Lastpage
640
Abstract
Time resolved emission microscopy (TRE) is a revolutionary tool used in advanced microprocessors silicon debug. Unlike other debug tools, the interpretation of TRE data may not be straightforward and can sometimes be misleading. In this paper we show through a case study why this is true. Interpretation of TRE data should be done carefully with good knowledge on device emission physics, circuit behavior and creative fault analysis.
Keywords
fault diagnosis; integrated circuit testing; microprocessor chips; silicon; time resolved spectroscopy; circuit behavior; circuit debug; creative fault analysis; device emission physics; microprocessors silicon debug; time resolved emission microscopy; time resolved emission prober; Circuits; Data mining; Energy states; Laser theory; Microprocessors; Microscopy; Probes; Silicon; Timing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Electronics, 2006. ICSE '06. IEEE International Conference on
Conference_Location
Kuala Lumpur
Print_ISBN
0-7803-9730-4
Electronic_ISBN
0-7803-9731-2
Type
conf
DOI
10.1109/SMELEC.2006.380711
Filename
4266694
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