• DocumentCode
    2992353
  • Title

    Kerr nonlinearity in silicon beyond 2.35μm

  • Author

    Zlatanovic, S. ; Gholami, F. ; Simic, A. ; Liu, L. ; Alic, N. ; Nezhad, M. ; Fainman, Y. ; Radic, S.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of California San Diego, La Jolla, CA, USA
  • fYear
    2011
  • fDate
    18-20 July 2011
  • Firstpage
    59
  • Lastpage
    60
  • Abstract
    We present measurements of χ(3) in silicon in the 2.35 to 2.75μm interval, showing Kerr coefficients close to 1×10-18 m2/W. The results clearly identify silicon as a promising platform for nonlinear processes in the mid-infrared.
  • Keywords
    elemental semiconductors; nonlinear optics; optical Kerr effect; silicon; Kerr coefficients; Kerr nonlinearity; Si; nonlinear processes; wavelength 2.35 mum to 2.75 mum; Absorption; Apertures; Laser beams; Measurement by laser beam; Optical filters; Silicon; Wavelength measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photonics Society Summer Topical Meeting Series, 2011 IEEE
  • Conference_Location
    Montreal, QC
  • ISSN
    Pending
  • Print_ISBN
    978-1-4244-5730-4
  • Type

    conf

  • DOI
    10.1109/PHOSST.2011.6000043
  • Filename
    6000043
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2992353