• DocumentCode
    2992377
  • Title

    Power MOSFET macromodel accounting for temperature dependence: parameter extraction and simulation

  • Author

    Leonardi, C. ; Frisina, F. ; Letor, R. ; Raciti, A.

  • Author_Institution
    STMicroelectron., Catania, Italy
  • fYear
    1998
  • fDate
    1998
  • Firstpage
    37
  • Lastpage
    47
  • Abstract
    A new PSpice model of power MOSFETs has been developed aiming to account for the parameter variations with the temperature. A new computer aided design package that helps the designer in the parameter extraction procedure is discussed in detail. The model accuracy has been tested by comparison of the simulated waveforms with the experimental traces relative to actual devices
  • Keywords
    SPICE; electronic design automation; power MOSFET; semiconductor device models; computer aided design package; parameter extraction; parameter extraction procedure; power MOSFET macromodel; simulated waveforms; simulation; temperature dependence; Circuit simulation; Circuit testing; Computational modeling; MOSFET circuits; Parameter extraction; Parasitic capacitance; Power MOSFET; Power system modeling; Temperature dependence; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computers in Power Electronics, 1998. 6th Workshop on
  • Conference_Location
    Cernobbio
  • ISSN
    1093-5142
  • Print_ISBN
    0-7803-4856-7
  • Type

    conf

  • DOI
    10.1109/CIPE.1998.779656
  • Filename
    779656