• DocumentCode
    2992388
  • Title

    Solder void reduction on solder die attach for SIP-LGA

  • Author

    Ho Tuck Ming ; Lily Khor

  • Author_Institution
    Carsem Technology Center, Carsem (M) Sdn Bhd S-Site, Lot 52986, Taman Meru Industrial Estate, Jelapang, P.O.Box 380, 30720 Ipoh, Perak, Malaysia
  • fYear
    2008
  • fDate
    4-6 Nov. 2008
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    SIP or System In Package as its name suggests is a package that consist of a combination of dies (asics, memory, mosfets etc), passive components or shielding in an IC package format. Due to design and layout complexity, it is normally required to be housed in a substrate based packaging. The connection of silicon die to package can be in the form of wire-bond, flipchip, epoxy die attach,or solder die attach. In cases where solder die attach is used, the challenge would lie in the ability to produce the least die attach void. The presence of solder void underneath the die is not desirable as it has thermal and in some cases electrical impact in the performance of the device. Solder voids, depending on its magnitude can also reduce the reliability and functionality of the device.
  • Keywords
    Assembly; Integrated circuit packaging; Lead; MOSFETs; Microassembly; Powders; Printing; Silicon; X-ray detection; X-ray detectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Manufacturing Technology Symposium (IEMT), 2008 33rd IEEE/CPMT International
  • Conference_Location
    Penang, Malaysia
  • ISSN
    1089-8190
  • Print_ISBN
    978-1-4244-3392-6
  • Electronic_ISBN
    1089-8190
  • Type

    conf

  • DOI
    10.1109/IEMT.2008.5507790
  • Filename
    5507790