DocumentCode
2992388
Title
Solder void reduction on solder die attach for SIP-LGA
Author
Ho Tuck Ming ; Lily Khor
Author_Institution
Carsem Technology Center, Carsem (M) Sdn Bhd S-Site, Lot 52986, Taman Meru Industrial Estate, Jelapang, P.O.Box 380, 30720 Ipoh, Perak, Malaysia
fYear
2008
fDate
4-6 Nov. 2008
Firstpage
1
Lastpage
4
Abstract
SIP or System In Package as its name suggests is a package that consist of a combination of dies (asics, memory, mosfets etc), passive components or shielding in an IC package format. Due to design and layout complexity, it is normally required to be housed in a substrate based packaging. The connection of silicon die to package can be in the form of wire-bond, flipchip, epoxy die attach,or solder die attach. In cases where solder die attach is used, the challenge would lie in the ability to produce the least die attach void. The presence of solder void underneath the die is not desirable as it has thermal and in some cases electrical impact in the performance of the device. Solder voids, depending on its magnitude can also reduce the reliability and functionality of the device.
Keywords
Assembly; Integrated circuit packaging; Lead; MOSFETs; Microassembly; Powders; Printing; Silicon; X-ray detection; X-ray detectors;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Manufacturing Technology Symposium (IEMT), 2008 33rd IEEE/CPMT International
Conference_Location
Penang, Malaysia
ISSN
1089-8190
Print_ISBN
978-1-4244-3392-6
Electronic_ISBN
1089-8190
Type
conf
DOI
10.1109/IEMT.2008.5507790
Filename
5507790
Link To Document