DocumentCode :
2992427
Title :
Effect of Well Thickness on the Intersubband Optical Absorptions in AlGaN/GaN/AlGaN Quantum Wells
Author :
Li, M. ; Fang, B. ; Li, R.H. ; Zhao, Z.Y. ; Zuo, W.J. ; Sun, G. ; Zhang, Y.J.
Author_Institution :
Coll. of Electr. & Inf. Eng., Xuchang Univ., Xuchang, China
fYear :
2012
fDate :
21-23 May 2012
Firstpage :
1
Lastpage :
4
Abstract :
By solving the Schrödinger and Poisson equations self-consistently for AlGaN/GaN QWs, we calculate the intersubband optical absorption coefficients for QWs with various well thicknesses. By increasing the well thickness, the amplitude of the dipole matrix increases slowly. However, the decrease of the energy separation results in the red-shift of the resonant absorption peak and the decrease of the magnitude of the absorption peak. Moreover, when the well thickness decreases to 10 Å, the evident decrease of the overlap between wave functions for the first two subbands leads to the abrupt decrease of the amplitude of the dipole matrix and the absorption peak. These results indicate that the intersubband optical absorption can be greatly modulated by the well thickness, the built-in electric field has an important effect on the intersubband absorption coefficients in III-nitride QWs, and III-nitride QWs are potential candidates for the design and application of intersubband devices.
Keywords :
III-V semiconductors; Poisson equation; Schrodinger equation; absorption coefficients; aluminium compounds; gallium compounds; semiconductor quantum wells; wide band gap semiconductors; AlGaN-GaN-AlGaN; Poisson equations; Schrodinger equations; absorption peak magnitude; built-in electric field; dipole matrix amplitude; energy separation; intersubband optical absorption coefficients; quantum wells; red-shift; resonant absorption peak; wave functions; well thickness effect; Absorption; Aluminum gallium nitride; Electric fields; Electron optics; Gallium nitride; High speed optical techniques; Wave functions;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photonics and Optoelectronics (SOPO), 2012 Symposium on
Conference_Location :
Shanghai
ISSN :
2156-8464
Print_ISBN :
978-1-4577-0909-8
Type :
conf
DOI :
10.1109/SOPO.2012.6270435
Filename :
6270435
Link To Document :
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