• DocumentCode
    2992483
  • Title

    Theoretical Analysis and Experimental Measurement on the Response Time of Optical Switch Based on VO2 Thin Film

  • Author

    Xiqu Chen ; Jie Li ; You Hu ; Ming Li

  • Author_Institution
    Sch. of Electr. & Electron. Eng., Wuhan Polytech. Univ., Wuhan, China
  • fYear
    2012
  • fDate
    21-23 May 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this paper, the physical thermal model for a typical optical switch based on VO2 thin film is built, according to which the response time parameter expression of the optical switch is obtained in theory. The expression of the response time parameter reveals key factors relevant to the switching speed of optical switch based on VO2 thin film and theoretically gives directions to improve the switching speed of this kind of optical switch. Furthermore, the proposed measurement means of response time parameter can be utilized to practical measure and test on optical switch.
  • Keywords
    optical switches; optical testing; thin film devices; time measurement; vanadium compounds; VO2; optical switch; optical test; physical thermal model; response time measurement; response time parameter expression; switching speed; thin film; Heating; Optical device fabrication; Optical films; Optical switches; Semiconductor device measurement; Time factors; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photonics and Optoelectronics (SOPO), 2012 Symposium on
  • Conference_Location
    Shanghai
  • ISSN
    2156-8464
  • Print_ISBN
    978-1-4577-0909-8
  • Type

    conf

  • DOI
    10.1109/SOPO.2012.6270438
  • Filename
    6270438