DocumentCode :
2992543
Title :
Solvent effect on the morphology of copper (I) oxide: A fundamental study towards copper (I) oxide-epoxy composites
Author :
Tan, Wee Lum ; Chew, K.Y. ; Hirmizi, N H Mohd ; Abu Bakar, M. ; Ismail, Juhaid ; Sim, L.C. ; Azmah
Author_Institution :
Nanosci. Res. Lab., Univ. Sains Malaysia, Minden, Malaysia
fYear :
2008
fDate :
4-6 Nov. 2008
Firstpage :
1
Lastpage :
4
Abstract :
The study on the influence of solvent environments on the Cu2O particles preparation via aqueous to organic phase transfer technique is described. In aqueous, the morphologies of the as-formed particles are of whisker-like or ellipsoidal shape dependent on the amount of CTAB used. At lower concentration of CTAB (r=2.7), Cu2O particles tend to form bundle of fine needle-like structures with an average diameter of 14.1±4.3 nm. Upon phase transfer process, transformation of Cu2O morphology occurred. Two organic solvents namely chloroform and toluene is studied. Chloroform with higher dielectric constant and dipole moment exert better particle-solvent interaction thus give better particle dispersion as compared to toluene. Addition of 10% v/v epoxy in the organic solvent further affects the particles morphology. Spherical particles as small as 8.1 ± 2.1 nm are obtained for Cu2O particles transferred into the 10%v/v epoxy/chloroform. Better solvation of epoxy resin in chloroform makes it a better stabilizer thus protecting the particles from agglomeration and secondary growth.
Keywords :
copper compounds; crystal morphology; electric moments; nanoparticles; permittivity; phase transformations; resins; solvation; solvent effects; Cu2O; aqueous phase transfer; chloroform; dipole moment; ellipsoidal shape particle; epoxy composite; epoxy resin; fine needle-like structure; higher dielectric constant; morphology; organic phase transfer; organic solvent; particle-solvent interaction; solvation; solvent effect; solvent environment; spherical particle; toluene; whisker-like shape particle; Conducting materials; Conductivity; Copper; Electrons; Laboratories; Morphology; Silver; Solvents; Temperature; Tiles;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Manufacturing Technology Symposium (IEMT), 2008 33rd IEEE/CPMT International
Conference_Location :
Penang
ISSN :
1089-8190
Print_ISBN :
978-1-4244-3392-6
Electronic_ISBN :
1089-8190
Type :
conf
DOI :
10.1109/IEMT.2008.5507798
Filename :
5507798
Link To Document :
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