Title :
A self-calibrating A/D converter using T-model neural network
Author :
Tang, Zheng ; Shirata, Yuichi ; Ishizuka, Okihiko ; Tanno, Koichi
Author_Institution :
Fac. of Eng., Miyazaki Univ., Japan
fDate :
30 Apr-3 May 1995
Abstract :
A self-calibrating analog-to-digital (A/D) converter employing a T-model neural network is described. Errors of the converter due to offset and device mismatch are corrected by a simple error back propagation algorithm in the T-model neural network. An experimental A/D converter using standard 5-μm CMOS IC circuits demonstrates high-performance analog-to-digital conversion and self-calibration
Keywords :
CMOS integrated circuits; analogue-digital conversion; backpropagation; calibration; error correction; neural chips; 5 micron; A/D converter; CMOS IC; T-model neural network; analog-to-digital conversion; error backpropagation algorithm; error correction; self-calibrating ADC; self-calibration; Analog-digital conversion; Back; CMOS analog integrated circuits; Counting circuits; Error correction; Laser radar; Matrix converters; Neural networks; Neurons; Signal processing algorithms;
Conference_Titel :
Circuits and Systems, 1995. ISCAS '95., 1995 IEEE International Symposium on
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-2570-2
DOI :
10.1109/ISCAS.1995.521568
