• DocumentCode
    2992678
  • Title

    Warpage simulation for chip-in-substrates

  • Author

    Jong Woon Kim ; Ju Pyo Hong ; Shan Gao ; Seog Moon Choi ; Sung Yi

  • Author_Institution
    Samsung Electro-Mech., Suwon, South Korea
  • fYear
    2008
  • fDate
    4-6 Nov. 2008
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In order to predict warpage of chip-in-substrate package, finite element analysis was carried out with modeling layers in chip and substrate and effective thermoelastic properties. The effects of design parameters such as pattern on the gap between chip and cavity, number of circuit layers, thickness and face direction of the chip, and gap width were investigated. The result shows that the warpage much depends on the internal structure and the effective thermoelastic properties.
  • Keywords
    chip scale packaging; finite element analysis; chip-in-substrate package; effective thermoelastic properties; finite element analysis; gap width; warpage simulation; Conducting materials; Conductivity; Copper; Electrons; Laboratories; Morphology; Silver; Solvents; Temperature; Tiles;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Manufacturing Technology Symposium (IEMT), 2008 33rd IEEE/CPMT International
  • Conference_Location
    Penang
  • ISSN
    1089-8190
  • Print_ISBN
    978-1-4244-3392-6
  • Electronic_ISBN
    1089-8190
  • Type

    conf

  • DOI
    10.1109/IEMT.2008.5507803
  • Filename
    5507803