DocumentCode
2992678
Title
Warpage simulation for chip-in-substrates
Author
Jong Woon Kim ; Ju Pyo Hong ; Shan Gao ; Seog Moon Choi ; Sung Yi
Author_Institution
Samsung Electro-Mech., Suwon, South Korea
fYear
2008
fDate
4-6 Nov. 2008
Firstpage
1
Lastpage
4
Abstract
In order to predict warpage of chip-in-substrate package, finite element analysis was carried out with modeling layers in chip and substrate and effective thermoelastic properties. The effects of design parameters such as pattern on the gap between chip and cavity, number of circuit layers, thickness and face direction of the chip, and gap width were investigated. The result shows that the warpage much depends on the internal structure and the effective thermoelastic properties.
Keywords
chip scale packaging; finite element analysis; chip-in-substrate package; effective thermoelastic properties; finite element analysis; gap width; warpage simulation; Conducting materials; Conductivity; Copper; Electrons; Laboratories; Morphology; Silver; Solvents; Temperature; Tiles;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Manufacturing Technology Symposium (IEMT), 2008 33rd IEEE/CPMT International
Conference_Location
Penang
ISSN
1089-8190
Print_ISBN
978-1-4244-3392-6
Electronic_ISBN
1089-8190
Type
conf
DOI
10.1109/IEMT.2008.5507803
Filename
5507803
Link To Document