Title :
New approaches to the true worst-case evaluation in circuit tolerance analysis. I. Calculation of the inner solution by genetic algorithms
Author :
Egiziano, L. ; Femia, N. ; Spagnuolo, G.
Author_Institution :
Dipt. di Ingegneria dell´´Inf. ed Ingegneria Elettrica, Salerno Univ., Italy
Abstract :
A new approach to the calculation of the true worst-case in circuit tolerance analysis (TWC-CTA) based on a genetic algorithm is presented in this paper. The GA solves the problem of minimizing the intrinsic underestimation error which affects stochastic methods in the calculation of the TWC with parameters characterized by large uncertainties. The joint application of the technique presented in this paper and in part II for the calculation of an overestimated solution ensures a reliable and efficient TWC evaluation
Keywords :
genetic algorithms; network analysis; tolerance analysis; circuit tolerance analysis; genetic algorithms; inner solution calculation; intrinsic underestimation error minimisation; stochastic methods; true worst-case evaluation; Circuit synthesis; Design automation; Electronic circuits; Genetic algorithms; Manufacturing; Production facilities; Stochastic processes; Stress; Tolerance analysis; Uncertainty;
Conference_Titel :
Computers in Power Electronics, 1998. 6th Workshop on
Conference_Location :
Cernobbio
Print_ISBN :
0-7803-4856-7
DOI :
10.1109/CIPE.1998.779670