Title :
Delay defect screening using process monitor structures
Author :
Mitra, Subhasish ; Volkerink, Erik ; McCluskey, E.J. ; Eichenberger, Stefan
Author_Institution :
Intel Corp., Sacramento, CA, USA
Abstract :
This paper presents delay test data collected from test chips fabricated in a 0.18 μ technology. The experimental data shows that process monitor structures such as on-chip ring oscillators are effective in identifying slow parts while performing transition fault testing at frequencies slower than the rated frequency.
Keywords :
delays; digital signal processing chips; fault diagnosis; integrated circuit testing; oscillators; process monitoring; system-on-chip; delay defect screening; delay test data; digital signal processing chips; on-chip ring oscillators; process monitor structures; test chips; transition fault testing; Delay; Monitoring; Testing; Very large scale integration;
Conference_Titel :
VLSI Test Symposium, 2004. Proceedings. 22nd IEEE
Print_ISBN :
0-7695-2134-7
DOI :
10.1109/VTEST.2004.1299224
