DocumentCode
2992967
Title
Effective Electrostatic Discharge detection in equipment via EMI
Author
Chia-Li Song ; Yeoh Teong-San
Author_Institution
Intel Technol., Bayan Lepas, Malaysia
fYear
2008
fDate
4-6 Nov. 2008
Firstpage
1
Lastpage
4
Abstract
Electrostatic Discharge (ESD) is a common quality issue in the semiconductor industry. ESD can be caused by improper human handling, poor equipment grounding, triboelectric charging, frictional movement, use of insulator material and many others. It is important to have the right method to detect the ESD event effectively. This paper will illustrate an actual case study on how Electromagnetic Interference (EMI) measurement techniques can be used to effectively detect the high speed ESD events versus the conventional ESD standard practices.
Keywords
electromagnetic interference; electrostatic discharge; EMI measurement techniques; ESD; electromagnetic interference; electrostatic discharge detection; frictional movement; improper human handling; insulator material; poor equipment grounding; semiconductor industry; triboelectric charging; Electromagnetic interference; Electronics industry; Electrostatic discharge; Electrostatic interference; Event detection; Grounding; Humans; Insulation; Measurement techniques; Semiconductor materials;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Manufacturing Technology Symposium (IEMT), 2008 33rd IEEE/CPMT International
Conference_Location
Penang
ISSN
1089-8190
Print_ISBN
978-1-4244-3392-6
Electronic_ISBN
1089-8190
Type
conf
DOI
10.1109/IEMT.2008.5507819
Filename
5507819
Link To Document