Title :
On comparison of NCR effectiveness with a reduced IDDQ vector set
Author :
Sabade, Sagar ; Walker, D.M.H.
Author_Institution :
Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
Abstract :
IDDQ test-based outlier rejection becomes difficult for deep sub-micron technology chips due to increased leakage and process variations. The use of neighbor current ratio (NCR) that uses wafer-level spatial correlation for identifying outlier chips has been proposed earlier as a means of coping with these issues. Due to the slow speed of IDDQ test, there is a strong motivation to reduce the number of test vectors without compromising the fault coverage. In this paper, we examine the effectiveness of neighbor current ratio using a reduced IDDQ vector set and industrial test data.
Keywords :
integrated circuit testing; large scale integration; leakage currents; IDDQ test; IDDQ vector set; deep submicron technology; fault coverage; industrial test data; large scale integration; neighbor current ratio; outlier chips; wafer level spatial correlation; Chromium; Circuit faults; Circuit testing; Computer science; Geometry; Leakage current; Manufacturing industries; Manufacturing processes; Threshold voltage; Transistors;
Conference_Titel :
VLSI Test Symposium, 2004. Proceedings. 22nd IEEE
Print_ISBN :
0-7695-2134-7
DOI :
10.1109/VTEST.2004.1299227
