DocumentCode
2993169
Title
Rule-based inspection of leadframes [IC manufacture]
Author
Dainis, George A. ; Ward, Matthew O.
Author_Institution
Texas Instrum. Inc., Attleboro, MA, USA
fYear
1988
fDate
5-9 Jun 1988
Firstpage
580
Lastpage
585
Abstract
A description is given of progress toward implementing a rule-based visual inspection system. The target product for inspection is integrated-circuit lead frames. A frame-based representation system is used to describe the product and defect categories. The system uses three levels of visual inspection to identify generic and specific inspection targets and defect categories
Keywords
computer vision; expert systems; inspection; integrated circuit manufacture; manufacturing computer control; packaging; IC lead frames; IC manufacture; computer vision; expert systems; factory automation; rule-based visual inspection system; Airports; Cameras; Data mining; Feature extraction; Head; Image analysis; Inspection; Manufacturing; Shape; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Vision and Pattern Recognition, 1988. Proceedings CVPR '88., Computer Society Conference on
Conference_Location
Ann Arbor, MI
ISSN
1063-6919
Print_ISBN
0-8186-0862-5
Type
conf
DOI
10.1109/CVPR.1988.196294
Filename
196294
Link To Document