Title :
High-Speed Scanning Optical Spectrum Measurement with Acousto-Optic Deflector
Author :
Oishi, Kazushi ; Ohta, Hiroshi
Author_Institution :
Yokogawa Electric Corp., 2-9-32 Nakacho, Musashino-shi, Tokyo 180-8750, Japan, e-mail: Kazushi.Ooishi@jp.yokogawa.com
Abstract :
We propose a new technique to measure an optical spectrum instantaneously by using an acousto-optic deflector. We successfully observed a wavelength-changed optical spectrum at 1-msec intervals with 100-¿sec scanning time and 80-pm wavelength resolution.
Keywords :
Diffraction gratings; Electric variables measurement; High speed optical techniques; IP networks; Optical diffraction; Optical fiber networks; Optical sensors; Time measurement; Voltage-controlled oscillators; Wavelength measurement;
Conference_Titel :
Optical Communications, 2006. ECOC 2006. European Conference on
Conference_Location :
Cannes, France
Print_ISBN :
978-2-912328-39-7
Electronic_ISBN :
978-2-912328-39-7
DOI :
10.1109/ECOC.2006.4801251
