Title :
March iC-: an improved version of March C- for ADOFs detection
Author :
Dilillo, L. ; Girard, P. ; Pravossoudovitch, S. ; Virazel, A. ; Borri, S.
Author_Institution :
Lab. d´´Inf., de Robotique et de Microelectron., Univ. of Montpellier II, France
Abstract :
This paper presents a new March test solution for detection of ADOFs (Address Decoder Open Faults), and resistive-ADOFs that are the consequence of resistive-open defects in address decoders of SRAM memories. In this study, we briefly analyze the test conditions and the March test requirements for these particular faults and we introduce some modifications to the well known March C- making it able to detect ADOFs and resistive-ADOFs, without increasing its complexity and its ability to detect the former target faults. The reformulation of March C-, called March iC-, is essentially based on introducing a particular address sequence and a particular read/write data sequence. The proposed March iC- extends the ability of March-based test solutions in detecting dynamic faults in SRAM memories.
Keywords :
SRAM chips; fault location; integrated circuit testing; logic testing; March C-; March iC-; March test; SRAM memories; read-write data sequence; resistive address decoder open faults detection; Decoding; Fault detection; Government; Random access memory; Robots; Silicon; Testing; Timing; Uniform resource locators; Very large scale integration;
Conference_Titel :
VLSI Test Symposium, 2004. Proceedings. 22nd IEEE
Print_ISBN :
0-7695-2134-7
DOI :
10.1109/VTEST.2004.1299236