• DocumentCode
    2993233
  • Title

    March iC-: an improved version of March C- for ADOFs detection

  • Author

    Dilillo, L. ; Girard, P. ; Pravossoudovitch, S. ; Virazel, A. ; Borri, S.

  • Author_Institution
    Lab. d´´Inf., de Robotique et de Microelectron., Univ. of Montpellier II, France
  • fYear
    2004
  • fDate
    25-29 April 2004
  • Firstpage
    129
  • Lastpage
    134
  • Abstract
    This paper presents a new March test solution for detection of ADOFs (Address Decoder Open Faults), and resistive-ADOFs that are the consequence of resistive-open defects in address decoders of SRAM memories. In this study, we briefly analyze the test conditions and the March test requirements for these particular faults and we introduce some modifications to the well known March C- making it able to detect ADOFs and resistive-ADOFs, without increasing its complexity and its ability to detect the former target faults. The reformulation of March C-, called March iC-, is essentially based on introducing a particular address sequence and a particular read/write data sequence. The proposed March iC- extends the ability of March-based test solutions in detecting dynamic faults in SRAM memories.
  • Keywords
    SRAM chips; fault location; integrated circuit testing; logic testing; March C-; March iC-; March test; SRAM memories; read-write data sequence; resistive address decoder open faults detection; Decoding; Fault detection; Government; Random access memory; Robots; Silicon; Testing; Timing; Uniform resource locators; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 2004. Proceedings. 22nd IEEE
  • ISSN
    1093-0167
  • Print_ISBN
    0-7695-2134-7
  • Type

    conf

  • DOI
    10.1109/VTEST.2004.1299236
  • Filename
    1299236