DocumentCode
2993347
Title
Sensing temperature in CMOS circuits for thermal testing
Author
Altet, J. ; Rubio, A. ; Salhi, A. ; Gálvez, J.L. ; Dilhaire, S. ; Syal, A. ; Ivanov, A.
Author_Institution
Dept. of Electron. Eng., Univ. Politecnica de Catalunya, Barcelona, Spain
fYear
2004
fDate
25-29 April 2004
Firstpage
179
Lastpage
184
Abstract
Temperature is a physical magnitude that can be used as an observable quantity for IC testing purposes. The authors discuss in this paper the suitability of two temperature measuring strategies applicable to standard CMOS integrated circuits: a laser interferometer and a differential fully CMOS built-in temperature sensor.
Keywords
CMOS integrated circuits; built-in self test; failure analysis; integrated circuit testing; light interferometry; temperature measurement; temperature sensors; CMOS built-in temperature sensor; CMOS integrated circuits; IC testing; failure analysis; light interferometry; temperature measurement; thermal testing; Automatic testing; Circuit testing; Electronic packaging thermal management; Failure analysis; Integrated circuit testing; Performance evaluation; Silicon; Temperature dependence; Temperature measurement; Temperature sensors;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2004. Proceedings. 22nd IEEE
ISSN
1093-0167
Print_ISBN
0-7695-2134-7
Type
conf
DOI
10.1109/VTEST.2004.1299241
Filename
1299241
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