Title :
Sensing temperature in CMOS circuits for thermal testing
Author :
Altet, J. ; Rubio, A. ; Salhi, A. ; Gálvez, J.L. ; Dilhaire, S. ; Syal, A. ; Ivanov, A.
Author_Institution :
Dept. of Electron. Eng., Univ. Politecnica de Catalunya, Barcelona, Spain
Abstract :
Temperature is a physical magnitude that can be used as an observable quantity for IC testing purposes. The authors discuss in this paper the suitability of two temperature measuring strategies applicable to standard CMOS integrated circuits: a laser interferometer and a differential fully CMOS built-in temperature sensor.
Keywords :
CMOS integrated circuits; built-in self test; failure analysis; integrated circuit testing; light interferometry; temperature measurement; temperature sensors; CMOS built-in temperature sensor; CMOS integrated circuits; IC testing; failure analysis; light interferometry; temperature measurement; thermal testing; Automatic testing; Circuit testing; Electronic packaging thermal management; Failure analysis; Integrated circuit testing; Performance evaluation; Silicon; Temperature dependence; Temperature measurement; Temperature sensors;
Conference_Titel :
VLSI Test Symposium, 2004. Proceedings. 22nd IEEE
Print_ISBN :
0-7695-2134-7
DOI :
10.1109/VTEST.2004.1299241
