Title :
Cu wire bond reliability improvement through focused heat treatment after bonding
Author :
Yow Kai Yun ; Eu Poh Leng
Author_Institution :
Freescale Semicond. Malaysia Sdn. Bhd., Petaling Jaya, Malaysia
Abstract :
Currently, there is a great interest in applying copper material to wire bonding of fine pitch assembly packaging, particularly for cost saving purposes. However, the hardness property of copper is harder compared to the conventional gold wire. The hardness factor of copper, coupled with the work hardening effect of the USG power and force during wire bonding, is a major cause for bond pad crack and pad cratering, especially on sensitive pad devices. Known methods to soften the FAB has been evaluated and discussed. Softening the FAB has proved to play a role in decreasing the bond pad cratering. However, it does not resolve the problem completely. The proposed solution is to introduce heat after wire bonding to enhance the intermetallic adhesion strength between the copper to the Al bond pad.
Keywords :
assembling; circuit reliability; copper; fine-pitch technology; heat treatment; lead bonding; Cu; USG power work hardening effect; bond pad crack; bond pad cratering; copper hardness property; copper wire bond reliability improvement; fine pitch assembly packaging; focused heat treatment; gold wire; intermetallic adhesion strength; sensitive pad devices; Assembly; Bonding forces; Copper; Costs; Gold; Heat treatment; Intermetallic; Packaging; Softening; Wire; Cu Bonding; Cu Wire; FAB. Fine Pitch Bonding;
Conference_Titel :
Electronic Manufacturing Technology Symposium (IEMT), 2008 33rd IEEE/CPMT International
Conference_Location :
Penang
Print_ISBN :
978-1-4244-3392-6
Electronic_ISBN :
1089-8190
DOI :
10.1109/IEMT.2008.5507838