DocumentCode
2993484
Title
An industry proof-of-concept demonstration of automated combinatorial test
Author
Bartholomew, Redge
Author_Institution
Rockwell Collins, Cedar Rapids, IA, USA
fYear
2013
fDate
18-19 May 2013
Firstpage
118
Lastpage
124
Abstract
Studies have found that the largest single cost and schedule component of safety-critical, embedded system development is software rework: locating and fixing software defects found during test. In many such systems these defects are the result of interactions among no more than 6 variables, suggesting that 6-way combinatorial testing would be sufficient to trigger and detect them. The National Institute of Standards and Technology developed an approach to automatically generating, executing, and analyzing such tests. This paper describes an industry proof-of-concept demonstration of automated unit and integration testing using this approach. The goal was to see if it might cost-effectively reduce rework by reducing the number of software defects escaping into system test - if it was adequately accurate, scalable, mature, easy to learn, and easy to use and still was able to achieve the required level of structural coverage. Results were positive - e.g., 2775 test input vectors were generated in 6 seconds, expected outputs were generated in 60 minutes, and executing and analyzing them took 8 minutes. Tests detected all seeded defects and in the proof-of-concept demonstration achieved nearly 100% structural coverage.
Keywords
embedded systems; program testing; 6-way combinatorial testing; National Institute of Standards and Technology; automated combinatorial test; automated integration testing; automated unit testing; embedded system development; software defect; software rework; test analysis; test execution; test generation; Embedded systems; Input variables; NIST; Radiation detectors; Testing; Vectors; combinatorial test; test automation; unit test;
fLanguage
English
Publisher
ieee
Conference_Titel
Automation of Software Test (AST), 2013 8th International Workshop on
Conference_Location
San Francisco, CA
Type
conf
DOI
10.1109/IWAST.2013.6595802
Filename
6595802
Link To Document