DocumentCode
2993494
Title
Sapphire resonators + SiGe transistors based ultra low phase noise microwave oscillators
Author
Boudot, R. ; Gribaldo, S. ; Giordano, V. ; Llopis, O. ; Rocher, C. ; Bazin, N. ; Cibiel, G.
Author_Institution
Dept. LPMO, Univ. de Franche-Comte
fYear
2005
fDate
29-31 Aug. 2005
Firstpage
865
Lastpage
871
Abstract
This paper reports on ultra-low phase noise microwave oscillators combining a room temperature high-Q whispering gallery mode (WGM) sapphire resonator and an ultra-low phase noise SiGe HBT based amplifier. An original symmetrical duralumin cavity has been designed in order to improve the thermal behavior of the resonator. Coupled to a high-precision electronic temperature controller, the structure presents a sensitivity to thermal fluctuations of -0.05 ppm/K. The non-linear and noise modelling of different microwave SiGe amplifiers have been realized in order to compute and optimize their phase noise performances. An original double stage amplifier, whose phase noise performances are very close of those of a single stage one, has been designed for X-band applications. C-band oscillators phase noise as low as -42 dB.rad2.Hz1at 1 Hz Fourier frequency and -135 dB.rad2.Hz1 at 1 kHz offset have been measured. X-band oscillators simulated phase noise results foresee very encouraging results
Keywords
Ge-Si alloys; Q-factor; cavity resonators; heterojunction bipolar transistors; microwave amplifiers; microwave oscillators; phase noise; sapphire; 1 kHz; C-band oscillators; HBT; SiGe; X-band oscillators; electronic temperature controller; microwave amplifiers; microwave oscillators; noise modelling; nonlinear modelling; phase noise; sapphire resonators; symmetrical duralumin cavity; thermal fluctuations; whispering gallery mode; Germanium silicon alloys; Heterojunction bipolar transistors; Microwave amplifiers; Microwave oscillators; Microwave transistors; Phase noise; Silicon germanium; Temperature control; Temperature sensors; Whispering gallery modes;
fLanguage
English
Publisher
ieee
Conference_Titel
Frequency Control Symposium and Exposition, 2005. Proceedings of the 2005 IEEE International
Conference_Location
Vancouver, BC
Print_ISBN
0-7803-9053-9
Type
conf
DOI
10.1109/FREQ.2005.1574047
Filename
1574047
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