An on-chip transfer function characterization system for analog built-in testing

Author

Valdes-Garcia, Alberto ; Silva-Martinez, Jose ; Sánchez-Sinencio, Edgar

Author_Institution

Analog & Mixed-Signal Center, Texas A&M Univ., College Station, TX, USA

fYear

2004

fDate

25-29 April 2004

Firstpage

261

Lastpage

266

Abstract

A compact system for the on-chip transfer function characterization of an analog circuit is presented. It consists of a phase and amplitude detector and a signal generator. A general methodology for the use of this structure in the functional verification of a circuit under test (CUT) is provided. An integrated implementation of the proposed system in CMOS 0.35 μm technology is described along with circuit-level design considerations. Experimental results of the application of this system in the characterization of a commercial programmable gain amplifier for frequencies up to 160 MHz are also presented.

Keywords

CMOS analogue integrated circuits; built-in self test; integrated circuit testing; phase detectors; signal generators; system-on-chip; transfer functions; 0.35 micron; CMOS technology; CUT; amplitude detector; analog built-in testing; analog circuits; circuit level design; circuit under test; on-chip transfer function characterization system; phase detector; programmable gain amplifier; signal generator; Analog circuits; CMOS technology; Circuit testing; Detectors; Integrated circuit technology; Phase detection; Signal generators; System testing; System-on-a-chip; Transfer functions;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Test Symposium, 2004. Proceedings. 22nd IEEE

ISSN

1093-0167

Print_ISBN

0-7695-2134-7

Type

conf

DOI

10.1109/VTEST.2004.1299252

Filename

1299252