Generalized sensitization using fault tuples

Fault tuples have introduced a fault model independent methodology for digital circuit test analysis. However, the {0, 1, X} algebra currently used with fault tuples allows only one form of path sensitization. The sensitization options for fault tuples is enhanced based on a 5-value algebra. The 5-value algebra enables a more detailed test analysis through the selection of one of three types of sensitization. Simulation experiments performed using the ITC´99 benchmark circuits for transition and path delay faults reveal that faults can be simultaneously analyzed under different types of sensitization criteria with little increase in memory and CPU time.