DocumentCode :
2993710
Title :
NGSHBI throughput optimization through innovative solution
Author :
Annamalai, Nagappan ; Choo Pak Kee ; Yeoh, K.S. ; Ismail, Wan Adibah Wan
Author_Institution :
Intel Technol., Bayan Lepas, Malaysia
fYear :
2008
fDate :
4-6 Nov. 2008
Firstpage :
1
Lastpage :
3
Abstract :
Productivity and cost savings are known key challenges in this competitive semiconductor industries. It has become more complex with the introduction of a new equipment, NGSHBI (Next Generation Self Heat Burn-In) integration into Test Operation. NGSHBI module was developed and deployed to support the product for Burn In requirement for chipset product. Moving into high product mix environment, the team encountered complexities with different package size design interception. With this multi form factor requirement, the design team provided fungible kit solution with new actuation bar design. The solution was not effective and also not factory friendly. This paper will outline how the key unproductive line item has been narrowed and solved through innovative solution
Keywords :
electronics packaging; NGSHBI throughput optimization; actuation bar design; cost savings; high product mix environment; multiform factor requirement; next generation self heat burn-in; package size design interception; semiconductor industries; Actuators; Costs; Manufacturing processes; Ovens; Packaging; Production facilities; Robots; Sockets; Testing; Throughput;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Manufacturing Technology Symposium (IEMT), 2008 33rd IEEE/CPMT International
Conference_Location :
Penang
ISSN :
1089-8190
Print_ISBN :
978-1-4244-3392-6
Electronic_ISBN :
1089-8190
Type :
conf
DOI :
10.1109/IEMT.2008.5507850
Filename :
5507850
Link To Document :
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