DocumentCode
2993719
Title
Fe distribution around hydride VPE InP:Fe regrown laser stripes
Author
Göbel, R. ; Janning, H. ; Burkhard, H.
Author_Institution
Deutsche Telekom AG, Darmstadt, Germany
fYear
1997
fDate
11-15 May 1997
Firstpage
55
Lastpage
57
Abstract
In hydride VPE, mesa stripe structures are regrown in a lateral growth mode exceeding the normal planar growth rate by more than an order of magnitude depending on the stripe orientation. During the embedding of mesas with InP:Fe a dilution of the Fe dopant due to the increased growth velocity in the vicinity of the original stripe might occur. An insufficient Fe level may effect loss of the required semi-insulating character. Thus, we analyzed regrown mesa structures with ⟨011⟩ and ⟨01-1⟩ orientation by SIMS. A moderate dilution of the Fe dopant down to ~30 % was found for lateral growth zones with an increase in growth rate up to a factor of 35. Therefore, our data indicate that the attractive advantages of the rapid lateral regrowth can be used without changing the conventional doping conditions
Keywords
III-V semiconductors; doping profiles; indium compounds; iron; secondary ion mass spectra; semiconductor doping; semiconductor growth; semiconductor lasers; vapour phase epitaxial growth; Fe distribution; Fe dopant dilution; InP:Fe; InP:Fe regrown laser stripes; SIMS depth profiles; growth rate; hydride VPE; lateral growth mode; mesa embedding; mesa stripe structures; rapid lateral regrowth; semi-insulating character; Doping; Dry etching; Indium phosphide; Iron; Laser modes; Optoelectronic devices; Polyimides; Production; Substrates; Thermal conductivity;
fLanguage
English
Publisher
ieee
Conference_Titel
Indium Phosphide and Related Materials, 1997., International Conference on
Conference_Location
Cape Cod, MA
ISSN
1092-8669
Print_ISBN
0-7803-3898-7
Type
conf
DOI
10.1109/ICIPRM.1997.600027
Filename
600027
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