• DocumentCode
    2993822
  • Title

    Testing systems wirelessly

  • Author

    Eberle, Hans ; Wander, Arvinderpal ; Gura, Nils

  • fYear
    2004
  • fDate
    25-29 April 2004
  • Firstpage
    335
  • Lastpage
    340
  • Abstract
    Wired test structures exhibit many unwanted dependencies: they typically use hierarchical and daisy-chained wiring, and they share interconnects and backplanes with the system under test. As a result, faults can easily lead to incomplete or erroneous test reports on properly working components. Wireless test structures do not have these shortcomings and thus, allow for more accurate testing and diagnosing. Wireless communication further allows for non-intrusive testing that does not require any cabling or physical access to the system under test. We describe two prototype implementations: a wireless field-replaceable unit ID and a wireless version of the popular JTAG standard.
  • Keywords
    fault diagnosis; integrated circuit testing; radio networks; daisy chained wiring; fault diagnosis; hierarchical wiring; joint test action group; nonintrusive testing; wireless communication; wireless testing systems; Backplanes; Bridges; Communication cables; Laboratories; Prototypes; Sun; System testing; Wireless communication; Wireless sensor networks; Wiring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 2004. Proceedings. 22nd IEEE
  • ISSN
    1093-0167
  • Print_ISBN
    0-7695-2134-7
  • Type

    conf

  • DOI
    10.1109/VTEST.2004.1299261
  • Filename
    1299261