DocumentCode :
2993947
Title :
Ultra low loop development
Author :
Song HuaJun
Author_Institution :
Leshan Phoenix Semicond. Co. Ltd., Leshan, China
fYear :
2008
fDate :
4-6 Nov. 2008
Firstpage :
1
Lastpage :
5
Abstract :
This technical paper presents the ultra low loop height challenges faced in the development of miniaturized SOT-923 package. It is drawn from the package development experiences for Flat Lead packages of 0.8 mm × 0.6 mm × 0.4 mm (SOD-923) which was successfully developed and introduced commercially. This product is mainly used on hand-held applications where the size has become smaller. Therefore, loop height is needed to be controlled very low. In order to achieve such low loop height, several solutions have been considered: i) Bonding mode selection; ii) capillary selection for ultra low loop requirement; iii) development of special bonding parameters for ultra low loop control. iv) final product quality evaluation and reliability requirement which included wire pull test, ball shear test, wire peeling test and reliability test.
Keywords :
reliability; semiconductor device packaging; SOD-923; ball shear test; bonding mode selection; capillary selection; flat lead packages; miniaturized SOT-923 package; product quality evaluation; reliability requirement; reliability test; size 0.4 mm; size 0.6 mm; size 0.8 mm; ultra low loop development; ultra low loop requirement; wire peeling test; wire pull test; Assembly; Bonding; Chip scale packaging; Fluctuations; Modems; Neck; Semiconductor device packaging; Shape; Testing; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Manufacturing Technology Symposium (IEMT), 2008 33rd IEEE/CPMT International
Conference_Location :
Penang
ISSN :
1089-8190
Print_ISBN :
978-1-4244-3392-6
Electronic_ISBN :
1089-8190
Type :
conf
DOI :
10.1109/IEMT.2008.5507860
Filename :
5507860
Link To Document :
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