Title :
Polarization enhancement measurement
Author :
Li, Yong-hang ; Li, Shao-hoiig ; Mao, Shi-yi
Author_Institution :
Beijing Univ. of Aeronaut. & Astronaut., China
Abstract :
Polarization, together with the amplitude, time and frequency of radar signals, completes the information which can be obtained on target returns in monostatic radar. The exploitation of information on the echo polarization state through polarimetric radars is currently a subject of interest, due to theoretical and technological advances, as well as to the development of new radar applications. The authors examine the enhancement of target echo by applying polarization and the measurement of enhanced radar target backscattered power. They have completed a set of lab tests and measured target backscattered wave character. The target backwave response is derived and analyzed. The degree of backwave enhancement is explained using the measurement results
Keywords :
Poincare mapping; adaptive radar; adaptive signal detection; backscatter; eigenvalues and eigenfunctions; electromagnetic wave polarisation; polarimetry; radar antennas; radar cross-sections; radar detection; radar polarimetry; radar signal processing; radar target recognition; Poincare sphere; adaptive polarization; antenna polarization; backwave enhancement; echo polarization state; eigenpolarization; eigenvalues; monostatic radar; optimum polarization; phase shifters; polarimetric radar; polarization agile antenna; polarization enhancement measurement; radar detection capability; radar target backscattered power; reduced scale airplane model; target backwave response; target polarization response; Antenna feeds; Antenna measurements; Eigenvalues and eigenfunctions; Frequency; Phase measurement; Phase shifters; Polarization; Power measurement; Radar applications; Radar measurements; Radar polarimetry; Radar theory; Receiving antennas; Signal generators; System testing; Testing; Transmitting antennas;
Conference_Titel :
Aerospace and Electronics Conference, 1995. NAECON 1995., Proceedings of the IEEE 1995 National
Conference_Location :
Dayton, OH
Print_ISBN :
0-7803-2666-0
DOI :
10.1109/NAECON.1995.521923