DocumentCode :
2994308
Title :
Point Process Analysis of Photon Limited Point Target Detection
Author :
Huang, Yu ; Zhang, Xiaofang ; Yu, Xin ; Zheng, Chunliang
Author_Institution :
Sch. of Optoelectron., Beijing Inst. of Technol., Beijing, China
fYear :
2012
fDate :
21-23 May 2012
Firstpage :
1
Lastpage :
4
Abstract :
Under the condition of photon limited, optical signal emitted by the ultra-weak point target is discrete photon flux, which is significantly different from the imaging feature of strong light. The theoretical analysis shows that the statistical properties of photon detection events subject to the Poisson process. In this paper, a new method of choosing threshold range, which bases on the criterion that the mean value and the variance are equal in Poisson distribution, is proposed to eliminate the background noise caused by imaging device in photon images. Point process analysis method is employed in this paper to test that the counting statistics obey Poisson distribution and the time statistics obey negative exponential distribution under the condition of photon limited, which is consistent with the theoretical analysis result. The expectation occurrence-rate of ultra-weak target and the recurrence probability in the follow period can be obtained quickly and directly by the point process analysis method. These two parameters can lay the foundations for detection, forecasting and tracking.
Keywords :
Poisson distribution; exponential distribution; object detection; optical images; optical noise; optical testing; photodetectors; photon counting; Poisson distribution; Poisson process; background noise; counting statistics; expectation occurrence-rate; imaging device; mean value; negative exponential distribution; photon flux; photon images; photon limited optical signal emission; photon limited point target detection; point process analysis; recurrence probability; statistical properties; strong light; threshold range; time statistics; ultraweak point target; Biomedical optical imaging; Educational institutions; Noise measurement; Optical imaging; Photonics; Probability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photonics and Optoelectronics (SOPO), 2012 Symposium on
Conference_Location :
Shanghai
ISSN :
2156-8464
Print_ISBN :
978-1-4577-0909-8
Type :
conf
DOI :
10.1109/SOPO.2012.6270518
Filename :
6270518
Link To Document :
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