DocumentCode :
2994324
Title :
A bayesian estimation of parameters for point local patch registration
Author :
Yang Hongbo ; Hou Xia ; Guan Lili
Author_Institution :
Sch. of Autom. & Sch. of Comput. Sci., Beijing Inf. Sci. & Technol. Univ., Beijing
fYear :
2008
fDate :
1-3 Sept. 2008
Firstpage :
311
Lastpage :
315
Abstract :
The local color distribution centered on feature point is usually used for image registration, in which the estimation for transformational parameters is the core problem. As the reported methods can not suit for large image deformations and are on the assumption that transformational parameters changes are followed by linear or Gaussian distribution so that the estimation process is easy to get into local extremum. So a Bayesian estimation of point local patch registration parameters is presented in this paper. This method apply MCMC algorithm to solve the posterior probability distribution problem and obtain the optimal parameters. The test results prove this method can perform point local patch registration under large image deformations accurately and successfully coped with target scale or orientation variations in video tracking.
Keywords :
Bayes methods; Markov processes; Monte Carlo methods; image colour analysis; image registration; probability; Bayesian estimation; Markov chain Monte Carlo method; image registration; local color distribution; point local patch registration; posterior probability distribution; Automation; Bayesian methods; Geometrical optics; Image motion analysis; Information science; Layout; Optical distortion; Parameter estimation; Probability distribution; Ultraviolet sources; Bayesian estimation; color distribution; point local patch registration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Automation and Logistics, 2008. ICAL 2008. IEEE International Conference on
Conference_Location :
Qingdao
Print_ISBN :
978-1-4244-2502-0
Electronic_ISBN :
978-1-4244-2503-7
Type :
conf
DOI :
10.1109/ICAL.2008.4636166
Filename :
4636166
Link To Document :
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