Title :
Reliability of flight critical system components and their “history of abuse”
Author :
Skormin, V.A. ; Popyack, L.J.
Author_Institution :
Univ. of Binghamton, NY, USA
Abstract :
Application of TSMD facilitates diagnostic procedures capable of assessment of the technical status of aircraft electronics on the basis of recorded operational and environmental conditions. This paper investigates logistic regression, cluster analysis and Bayes technique as statistical tools suitable for the analysis of the effects of adverse environmental conditions on failures of electronic components
Keywords :
Bayes methods; aircraft computers; aircraft control; failure analysis; pattern recognition; reliability theory; Bayes technique; TSMD; adverse environmental conditions; aircraft electronics; cluster analysis; diagnostic procedures; electronic components; failures; flight critical system components; logistic regression; reliability; statistical tools; technical status; Aerospace electronics; Aircraft; Condition monitoring; Electronic components; Failure analysis; History; Logistics; Mathematical model; Temperature; Vibrations;
Conference_Titel :
Aerospace and Electronics Conference, 1995. NAECON 1995., Proceedings of the IEEE 1995 National
Conference_Location :
Dayton, OH
Print_ISBN :
0-7803-2666-0
DOI :
10.1109/NAECON.1995.521968
