DocumentCode
299433
Title
Reliability of flight critical system components and their “history of abuse”
Author
Skormin, V.A. ; Popyack, L.J.
Author_Institution
Univ. of Binghamton, NY, USA
Volume
1
fYear
1995
fDate
22-26 May 1995
Firstpage
376
Abstract
Application of TSMD facilitates diagnostic procedures capable of assessment of the technical status of aircraft electronics on the basis of recorded operational and environmental conditions. This paper investigates logistic regression, cluster analysis and Bayes technique as statistical tools suitable for the analysis of the effects of adverse environmental conditions on failures of electronic components
Keywords
Bayes methods; aircraft computers; aircraft control; failure analysis; pattern recognition; reliability theory; Bayes technique; TSMD; adverse environmental conditions; aircraft electronics; cluster analysis; diagnostic procedures; electronic components; failures; flight critical system components; logistic regression; reliability; statistical tools; technical status; Aerospace electronics; Aircraft; Condition monitoring; Electronic components; Failure analysis; History; Logistics; Mathematical model; Temperature; Vibrations;
fLanguage
English
Publisher
ieee
Conference_Titel
Aerospace and Electronics Conference, 1995. NAECON 1995., Proceedings of the IEEE 1995 National
Conference_Location
Dayton, OH
ISSN
0547-3578
Print_ISBN
0-7803-2666-0
Type
conf
DOI
10.1109/NAECON.1995.521968
Filename
521968
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