DocumentCode
2994559
Title
Fabrication of nanoporous polyimide of low dielectric constant
Author
Othman, Mohd Bisyrul Hafi ; Ahmad, Zainal ; Akil, Hazizan Md
Author_Institution
Sch. of Mater. & Miner. Resources Eng., Univ. Sains Malaysia, Nibong Tebal, Malaysia
fYear
2008
fDate
4-6 Nov. 2008
Firstpage
1
Lastpage
4
Abstract
Polyimide is a choice of material widely used in electronic packaging due to its high thermal and mechanical stability and low thermal expansion coefficient and dielectric constant. Two porous polyimides of structure shown in the following figure were successfully synthesised. The reaction scheme involve polycondensation of 3,3\´,4,4\´-biphenyltetracarboxylic dianhydride with 4",4\´\´\´-(hexafluoroisopropyllidene)-bis(4-phenoxyaniline) and 4,4\´-(4,4\´-isopropylidenediphenyl-1,1\´-diyldioxy) dianiline followed by thermal curing of the intermediate polyamic acid. This treatment afforded a high molecular mass polyimide of tough and thermally stable polymer. Nanofoam polyimide films were fabricated by means of sol-gel technique to give a homogeneously dispersed nano-sized voids in range 100-400 nm. Both materials showed an ultra-low dielectric constant of 2.76 and 2.84 respectively. Comparison of the treated and non-treated polyimide films showed that the gain in low dielectric constant is achieved at a considerable expanse of mechanical properties.
Keywords
electronics packaging; mechanical stability; nanofabrication; nanoporous materials; permittivity; polymers; sol-gel processing; thermal expansion; thermal stability; electronic packaging; high molecular mass polyimide; intermediate polyamic acid; low dielectric constant; low thermal expansion coefficient; mechanical property; mechanical stability; nanofoam polyimide films; nanoporous polyimide fabrication; polycondensation; size 100 nm to 400 nm; sol-gel technique; thermal curing; thermal stability; Curing; Dielectric constant; Dielectric materials; Electronic packaging thermal management; Electronics packaging; Fabrication; Nanoporous materials; Polyimides; Thermal expansion; Thermal stability;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Manufacturing Technology Symposium (IEMT), 2008 33rd IEEE/CPMT International
Conference_Location
Penang
ISSN
1089-8190
Print_ISBN
978-1-4244-3392-6
Electronic_ISBN
1089-8190
Type
conf
DOI
10.1109/IEMT.2008.5507888
Filename
5507888
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