Title :
A new generalized likelihood ratio philosophy
Author :
Hatsell, C.P. ; Nolte, L.W.
Author_Institution :
U.S. Air Force Institute of Technology, Wright-Patterson AFB, Ohio
Abstract :
A new philosophy for designing detection devices is presented which embodies some of the better features of the classical generalized likelihood ratio test and the classical Bayes test. A feature of the new Bayes generalized likelihood ratio test is that it provides a unified procedure for utilizing parameter estimates in detector design. Its use depends on the existance of an asymtotically unbiased estimator for the unknown parameters. If such an estimator is easily implemented, then the new test should be particularly attractive.
Keywords :
Q measurement; Testing;
Conference_Titel :
Adaptive Processes (9th) Decision and Control, 1970. 1970 IEEE Symposium on
Conference_Location :
Austin, TX, USA
DOI :
10.1109/SAP.1970.269961