Title :
Close-in Phase Noise of a Digitally Tuned VCO
Author :
Yang, Long ; Pedrotti, Ken
Author_Institution :
Dept. of Electrical Engineering, University of California, Santa Cruz, CA 95064. Email: yanggz@cse.ucsc.edu
Abstract :
Here we present analysis and simulation of the close-in phase noise of a digitally tuned VCO, tunable only in discrete frequency steps. By rapidly tuning between two closely spaced discrete frequencies with a variable duty cycle any average frequency can be achieved. This process will result in increased phase noise and spurs if a strictly periodic duty cycle modulation is used. Ideally a randomly varying digital control signal with the appropriate duty cycle should be used to eliminate spurs and smooth the close-in phase noise. Here we use continuous-phase-frequency-shifting-key (CPFSK) modulation results from communication theory to analytically predict the effect of a random modulation at 50% duty cycle. Next the use of a sigma-delta modulator to produce a randomly varying digital signal with continuously variable duty cycle is simulated and compared to our analytical result. The use of a simple repetitive duty cycle modulation produced by a phase detector controlling the VCO in a PLL is also investigated. We present a comparison of the close-in phase noise for these possible approaches to the realization of an all digital PLL and demonstrate the improvement possible with the use of sigma-delta modulation.
Keywords :
Analytical models; Delta-sigma modulation; Digital control; Digital modulation; Frequency; Phase locked loops; Phase modulation; Phase noise; Tuning; Voltage-controlled oscillators;
Conference_Titel :
Circuits and Systems, 2006. MWSCAS '06. 49th IEEE International Midwest Symposium on
Conference_Location :
San Juan, PR
Print_ISBN :
1-4244-0172-0
Electronic_ISBN :
1548-3746
DOI :
10.1109/MWSCAS.2006.381992