DocumentCode :
2994885
Title :
Recognition of Symmetry Structure by Use of Gestalt Algebra
Author :
Michaelsen, Eckart ; Muench, Daniel ; Arens, Michael
Author_Institution :
Fraunhofer IOSB, Ettlingen, Germany
fYear :
2013
fDate :
23-28 June 2013
Firstpage :
206
Lastpage :
210
Abstract :
While most approaches to symmetry detection in machine vision try to explain the gray-values or colors of the pixels, Gestalt algebra has no room for such measurement data. The entities (i.e. Gestalten) are only defined with respect to each other. They form a generic hierarchy, and live in a continuous domain without any pixel raster. There is also no constraint forcing them to completely fill an image, or prohibiting overlap. Yet, when used as a tool for symmetry recognition, the algebra must be somehow connected to the given data. In this paper this is done only on the primitive level using the well-known SIFT feature detector. From a set of such SIFT-based Gestalten follows a combinatorial set of higher-order symmetric Gestalten by constructing all possible terms using the operations of the algebra. The Gestalt domain contains a quality or assessment dimension. Taking the best Gestalten with respect to this attribute and clustering them yields the output for this competition participation.
Keywords :
algebra; computer vision; feature extraction; object detection; object recognition; Gestalt algebra; SIFT feature detector; SIFT-based Gestalten; machine vision; primitive level; symmetric Gestalten; symmetry detection; symmetry structure recognition; Algebra; Buildings; Computer graphics; Computer vision; Image color analysis; Mirrors; Pattern recognition; algebraic approach; bottom-up search; mirror-symmetry; repetitive patters;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision and Pattern Recognition Workshops (CVPRW), 2013 IEEE Conference on
Conference_Location :
Portland, OR
Type :
conf
DOI :
10.1109/CVPRW.2013.37
Filename :
6595876
Link To Document :
بازگشت