• DocumentCode
    2994893
  • Title

    Research on on-line inspection system for moisture content of fabric based on LabVIEW

  • Author

    Junfeng, Jing ; Pengfei, Li ; Hongwei, Zhang ; Luhua, Nie

  • Author_Institution
    Coll. of Electron. & Inf., Xi´´an Polytech. Univ., Xi´´an, China
  • fYear
    2009
  • fDate
    26-29 Nov. 2009
  • Firstpage
    2114
  • Lastpage
    2117
  • Abstract
    This paper presents a method of moisture content detection from fabrics based on microwave. The moisture content of fabric fair influences efficiency and cost of produce. Thus, it is important to measure it exactly. Firstly, based on the absorbency effect of fabric with moisture about microwave, aiming at the requirement of most corporations for inspection and control of moisture content for fabric, the microwave technology is used to inspect moisture content, that is to say, a hygrometric scheme of microwave is designed. On this basis, the tested data are transmitted to the computer through data acquisition card and LabVIEW is applied to collect and process the data. Finally, the moisture content of textile is displayed on the computer screen. The factors affecting the measurement precision are analysed in this paper. The result shows that the method is feasible and can meet the requirement of manufacture.
  • Keywords
    absorption; automatic optical inspection; data acquisition; fabrics; hygrometers; microwave technology; moisture; textile industry; virtual instrumentation; LabVIEW; absorbency effect; computer screen; data acquisition card; fabric; hygrometric scheme; microwave technology; moisture content detection; online inspection system; textile; Computer displays; Costs; Data acquisition; Fabrics; Inspection; Microwave technology; Microwave theory and techniques; Moisture control; Testing; Textile technology; DAQ; LabVIEW; Microwave; Moisture content; On-line inspection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Industrial Design & Conceptual Design, 2009. CAID & CD 2009. IEEE 10th International Conference on
  • Conference_Location
    Wenzhou
  • Print_ISBN
    978-1-4244-5266-8
  • Electronic_ISBN
    978-1-4244-5268-2
  • Type

    conf

  • DOI
    10.1109/CAIDCD.2009.5374969
  • Filename
    5374969