DocumentCode
2995144
Title
What comes first-RAMCAD or a new RAM methodology?
Author
Jackson, Tyrone
Author_Institution
TRW S&TG, Redondo Beach, CA, USA
fYear
1988
fDate
26-28 Jan 1988
Firstpage
32
Lastpage
38
Abstract
A practical methodology of a future reliability program is discussed. Seven major lessons learned from today´s reliability methodology are also examined. These lessons are translated into requirements that can implement the projected computerized reliability programs. Draft revisions of two MIL-STD-785B tasks (204 and 205) are presented to exemplify the modernization of current reliability program requirements
Keywords
maintenance engineering; reliability; computerized reliability programs; maintainability; modernization; Application software; Circuit analysis; Circuit analysis computing; Costs; Design automation; Design optimization; Military computing; Process design; Read-write memory; Reliability engineering;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium, 1988. Proceedings., Annual
Conference_Location
Los Angeles, CA
Type
conf
DOI
10.1109/ARMS.1988.196414
Filename
196414
Link To Document