DocumentCode
2995272
Title
Temperature dependent MOSFET RF large signal model incorporating self heating effects
Author
Heo, D. ; Chen, E. ; Gebara, E. ; Yoo, S. ; Laskar, J. ; Anderson, T.
Author_Institution
Microelectron. Res. Center, Georgia Inst. of Technol., Atlanta, GA, USA
Volume
2
fYear
1999
fDate
13-19 June 1999
Firstpage
415
Abstract
We present a new temperature dependent large signal model with self heating and ambient temperature effects for power MOSFETs developed from on-wafer pulse I-V measurements at different ambient temperatures. The MOSFET channel current equation in the model has temperature parameters and continuity in high order derivatives to predict temperature effects and harmonics accurately. The data from the model with self heating effects demonstrates good agreement with measured S parameters and power characteristics including gain, efficiency, harmonic components and intermodulation powers in class AB operation.
Keywords
UHF field effect transistors; equivalent circuits; harmonics; intermodulation; microwave field effect transistors; microwave power transistors; power MOSFET; semiconductor device models; thermal analysis; MOSFET channel current equation; RF large signal model; S-parameters; ambient temperature effects; class AB operation; harmonics; intermodulation power; onwafer pulse I-V measurements; power MOSFETs; power characteristics; self heating effects; temperature dependent MOSFET model; temperature effects prediction; Equations; Heating; MOSFET circuits; Power MOSFET; Power measurement; Predictive models; Pulse measurements; RF signals; Radio frequency; Temperature dependence;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1999 IEEE MTT-S International
Conference_Location
Anaheim, CA, USA
Print_ISBN
0-7803-5135-5
Type
conf
DOI
10.1109/MWSYM.1999.779791
Filename
779791
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