• DocumentCode
    2995272
  • Title

    Temperature dependent MOSFET RF large signal model incorporating self heating effects

  • Author

    Heo, D. ; Chen, E. ; Gebara, E. ; Yoo, S. ; Laskar, J. ; Anderson, T.

  • Author_Institution
    Microelectron. Res. Center, Georgia Inst. of Technol., Atlanta, GA, USA
  • Volume
    2
  • fYear
    1999
  • fDate
    13-19 June 1999
  • Firstpage
    415
  • Abstract
    We present a new temperature dependent large signal model with self heating and ambient temperature effects for power MOSFETs developed from on-wafer pulse I-V measurements at different ambient temperatures. The MOSFET channel current equation in the model has temperature parameters and continuity in high order derivatives to predict temperature effects and harmonics accurately. The data from the model with self heating effects demonstrates good agreement with measured S parameters and power characteristics including gain, efficiency, harmonic components and intermodulation powers in class AB operation.
  • Keywords
    UHF field effect transistors; equivalent circuits; harmonics; intermodulation; microwave field effect transistors; microwave power transistors; power MOSFET; semiconductor device models; thermal analysis; MOSFET channel current equation; RF large signal model; S-parameters; ambient temperature effects; class AB operation; harmonics; intermodulation power; onwafer pulse I-V measurements; power MOSFETs; power characteristics; self heating effects; temperature dependent MOSFET model; temperature effects prediction; Equations; Heating; MOSFET circuits; Power MOSFET; Power measurement; Predictive models; Pulse measurements; RF signals; Radio frequency; Temperature dependence;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 1999 IEEE MTT-S International
  • Conference_Location
    Anaheim, CA, USA
  • Print_ISBN
    0-7803-5135-5
  • Type

    conf

  • DOI
    10.1109/MWSYM.1999.779791
  • Filename
    779791