Title :
A Super Steep Mo Tip Fea Fabrication And Emission Characteristics
Author :
Imura, Hironori ; Makishima, Hideo ; Yamada, Kcizo
Author_Institution :
NEC Corp.
Keywords :
Apertures; Electron emission; Fabrication; Field emitter arrays; Microelectronics; National electric code; Scanning electron microscopy; Sensor phenomena and characterization; Standards development; Threshold voltage;
Conference_Titel :
Vacuum Microelectronics Conference, 1993., Proceedings of IEEE 6th International
Print_ISBN :
0-7803-0852-2
DOI :
10.1109/IVMC.1993.700244