DocumentCode
2995658
Title
Measure selection and pattern recognition applied to clinical electroencephalograms
Author
Solosko, R.B. ; Bishop, R.R. ; Jeffreys, W.H.
Author_Institution
Cornell Aeronautical Laboratory, Buffalo, New York
fYear
1970
fDate
7-9 Dec. 1970
Firstpage
184
Lastpage
184
Abstract
Present techniques of analysis of electroencephalograms (EEGs) require the neurologist to visually scan long segments of the EEG in order to obtain some. diagnostic information. However, much of the information contained in the EEG is lost in the process, and other diagnostic methods are generally required to accurately detect cerebral disorders. The purpose of the study described in this paper is to apply signal processing, measure selection, and pattern recognition techniques to the EEG in order to devise a more accurate and safer method of diagnosis. A particular cerebral disorder, cerebrovascular insufficiency, was used as the basis for the investigation. The analysis of the EEGs can be divided into several stages: recording and digitizing the EEG, making measurements on the EEG, reducing the number of measures to a few representative factors, and analyzing with pattern recognition.
Keywords
Electroencephalography; Fluid flow measurement; Gain measurement; Length measurement; Measurement standards; Pattern recognition; Power measurement; Size measurement; Sleep; Time measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Adaptive Processes (9th) Decision and Control, 1970. 1970 IEEE Symposium on
Conference_Location
Austin, TX, USA
Type
conf
DOI
10.1109/SAP.1970.270013
Filename
4044668
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