Title :
METS meets the F-15E supportability challenge
Author :
Yates, Wilson D., III
Author_Institution :
McDonnell Aircraft Co., St. Louis, MO, USA
Abstract :
The Mobile Electronic Test Set (METS) F-15 avionics intermediate shop (AIS) automatic test equipment (ATE) is described. METS takes advantage of the stimuli/measurement capability for a printed circuit board available for portable testers. Because METS uses six parallel high-speed microprocessors and distributed processing techniques, it provides a real-time multitasking test environment. The extensive built-in testing (BIT) capability of each unit is utilized by METS to assist in the fault isolation. The evolution of F-15 AIS ATE to the METS is presented as a function of a combination of changes in US Air Force operational requirements and improvements in line replaceable unit (LRU) testability
Keywords :
aerospace computing; aircraft instrumentation; automatic test equipment; fault location; military computing; parallel processing; ATE; F-15 avionics intermediate shop; Mobile Electronic Test Set; US Air Force; automatic test equipment; built-in testing; distributed processing techniques; fault isolation; line replaceable unit; parallel high-speed microprocessors; portable testers; printed circuit board; real-time multitasking test environment; Aerospace electronics; Automatic test equipment; Automatic testing; Circuit faults; Circuit testing; Distributed processing; Electronic equipment testing; Microprocessors; Multitasking; Printed circuits;
Conference_Titel :
Reliability and Maintainability Symposium, 1988. Proceedings., Annual
Conference_Location :
Los Angeles, CA
DOI :
10.1109/ARMS.1988.196461
