• DocumentCode
    2996079
  • Title

    Automatic error recovery in targetless logic emulation

  • Author

    Banerjee, Somnath ; Gupta, Tushar

  • Author_Institution
    Mentor Graphics Pvt. Ltd., India
  • fYear
    2009
  • fDate
    15-16 July 2009
  • Firstpage
    380
  • Lastpage
    384
  • Abstract
    Targetless logic emulation refers to a verification system in which there are no external hardware targets interfacing with the emulator. In such systems input stimuli to the DUT come either from a user provided vector file or a HDL testbench running on a software simulator and the DUT runs on hardware based logic emulator. Many users use such targetless environment for automated long running verification tests consisting of huge sets of input stimuli, consequently an automatic recovery method is of significant interest in such systems. The automatic error recovery method shall be able to complete the emulation session gracefully skipping error points and subsequently report various errors and mismatch conditions for user debug. The paper presents a novel methodology and verification infrastructure based on periodic checkpointing, which provides a robust way of error condition detection, subsequent restoration of last saved system state and resume emulation run by skipping offending operations. It does not require any special hardware extension and provides a fully customizable checkpoint frequency selection scheme. It is seen to add only a minimal overhead on overall hardware emulation speed.
  • Keywords
    checkpointing; program verification; system monitoring; DUT; FPGA; HDL; automated long running verification test; automatic error recovery; automatic recovery method; customizable checkpoint frequency selection scheme; design under test; error condition detection; field programmable logic array; hardware description language; targetless logic emulation; verification system; Automatic logic units; Automatic testing; Checkpointing; Emulation; Hardware design languages; Logic testing; Resumes; Robustness; Software testing; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design, 2009. ASQED 2009. 1st Asia Symposium on
  • Conference_Location
    Kuala Lumpur
  • Print_ISBN
    978-1-4244-4952-1
  • Electronic_ISBN
    978-1-4244-4952-1
  • Type

    conf

  • DOI
    10.1109/ASQED.2009.5206235
  • Filename
    5206235