DocumentCode
2996217
Title
Off the bathtub onto the roller-coaster curve [electronic equipment failure]
Author
Wong, Kam L. ; Lindstrom, Dean L.
Author_Institution
Kambea Ind., Manhattan Beach, CA, USA
fYear
1988
fDate
26-28 Jan 1988
Firstpage
356
Lastpage
363
Abstract
In 1981 it was revealed that the instantaneous failure rate of a piece of electronic equipment decreases with age during its useful life and that the bathtub characteristic for hazard rate is an exception rather than the rule. The shape of the hazard rate curve for this device is studied by the authors. Investigators studying semiconducting device burn-in subscribe to the concept of freak failures which manifest themselves as a hump on the hazard rate curve. The authors call these curves the roller-coaster curves. It was postulated that aside from the long-term gross wear-out failures, all other failures develop from flaws. With some general assumptions on the flaw size distribution, one can show (by applying fatigue theory) that the flaws would emerge as failures that give a decreasing failure rate
Keywords
failure analysis; reliability; semiconductor devices; bathtub characteristic; electronic equipment failure; fatigue theory; flaws; gross wear-out failures; hazard rate curve; instantaneous failure rate; reliability; roller-coaster curves; semiconducting device burn-in; Electronic equipment; Electronics industry; Fatigue; Hazards; Inspection; Manufacturing; Satellites; Semiconductivity; Shape; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium, 1988. Proceedings., Annual
Conference_Location
Los Angeles, CA
Type
conf
DOI
10.1109/ARMS.1988.196476
Filename
196476
Link To Document