• DocumentCode
    2996463
  • Title

    Electrostatic and Piezoelectric Testing Methods for RF MEMS Resonators

  • Author

    Sepulveda, Nelson ; Toledo-Quiñones, Manuel

  • Author_Institution
    Univ. of Puerto Rico, Mayaguez
  • Volume
    1
  • fYear
    2006
  • fDate
    6-9 Aug. 2006
  • Firstpage
    405
  • Lastpage
    409
  • Abstract
    Two techniques to characterize diamond micromechanical resonator structures are described: (1) electrostatic testing, and (2) piezoelectric actuation with optical detection. It is found that, while the resonant frequency values obtained from the two techniques differ only by 3%, method (2) yield up to eight times larger estimates for the quality factor Q. After describing the techniques and discussing experimental results, an explanation based on the different pressure regimes used on the two testing methods is proposed to explain this apparent discrepancy.
  • Keywords
    Q-factor; electrostatics; micromechanical resonators; piezoelectricity; RF MEMS; diamond micromechanical resonator structures; electrostatic testing methods; piezoelectric testing methods; quality factor; resonant frequency; Electrostatics; Frequency estimation; Micromechanical devices; Optical detectors; Optical resonators; Q factor; Radiofrequency microelectromechanical systems; Resonant frequency; Testing; Yield estimation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2006. MWSCAS '06. 49th IEEE International Midwest Symposium on
  • Conference_Location
    San Juan
  • ISSN
    1548-3746
  • Print_ISBN
    1-4244-0172-0
  • Electronic_ISBN
    1548-3746
  • Type

    conf

  • DOI
    10.1109/MWSCAS.2006.382084
  • Filename
    4267161