Title :
Low-freouency Fluctuation Characteristics And Current Stability Of Thin Film Field Emission Cathodes
Author :
Bakhtizin, R.Z. ; Chubun, N.N. ; Djueua, B.C. ; Ghots, S.S. ; Yumaghuzin, Y.M.
Author_Institution :
Bashkir State University
Keywords :
Cathodes; Fluctuations; Microcell networks; Stability; Substrates; Transistors;
Conference_Titel :
Vacuum Microelectronics Conference, 1993., Proceedings of IEEE 6th International
Print_ISBN :
0-7803-0852-2
DOI :
10.1109/IVMC.1993.700253
