• DocumentCode
    2996709
  • Title

    How organic substrate structure & design improve assembly robustness

  • Author

    Low, B.Y. ; Ravishankar, R.

  • Author_Institution
    Freescale Semicond. (M) Sdn. Bhd., Petaling Jaya, Malaysia
  • fYear
    2009
  • fDate
    15-16 July 2009
  • Firstpage
    212
  • Lastpage
    215
  • Abstract
    This paper focuses on how the PBGA (plastic ball grid array) organic substrate structure and traces design improve the assembly packaging robustness. Via plugging process at the substrate fabrication has been studied. Comparison of substrate without via plug, laminate substrate with via plugging process increases the overall hardness of the substrate. This is due to the via plug materials use (IR6) is a harder materials than the solder resist. Another area of study is the addition of dummy traces design on the air venting area improves the solder resist evenness by elimination mold resin bleed.
  • Keywords
    ball grid arrays; solders; PBGA; air venting area; assembly packaging robustness; assembly robustness design; dummy traces; mold resin bleed elimination; organic substrate structure; plastic ball grid array; plug materials use; plugging process; solder resist; substrate fabrication; Assembly; Electrical resistance measurement; Laminates; Packaging; Plugs; Resins; Resists; Robustness; Substrates; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design, 2009. ASQED 2009. 1st Asia Symposium on
  • Conference_Location
    Kuala Lumpur
  • Print_ISBN
    978-1-4244-4952-1
  • Electronic_ISBN
    978-1-4244-4952-1
  • Type

    conf

  • DOI
    10.1109/ASQED.2009.5206269
  • Filename
    5206269