DocumentCode
2996709
Title
How organic substrate structure & design improve assembly robustness
Author
Low, B.Y. ; Ravishankar, R.
Author_Institution
Freescale Semicond. (M) Sdn. Bhd., Petaling Jaya, Malaysia
fYear
2009
fDate
15-16 July 2009
Firstpage
212
Lastpage
215
Abstract
This paper focuses on how the PBGA (plastic ball grid array) organic substrate structure and traces design improve the assembly packaging robustness. Via plugging process at the substrate fabrication has been studied. Comparison of substrate without via plug, laminate substrate with via plugging process increases the overall hardness of the substrate. This is due to the via plug materials use (IR6) is a harder materials than the solder resist. Another area of study is the addition of dummy traces design on the air venting area improves the solder resist evenness by elimination mold resin bleed.
Keywords
ball grid arrays; solders; PBGA; air venting area; assembly packaging robustness; assembly robustness design; dummy traces; mold resin bleed elimination; organic substrate structure; plastic ball grid array; plug materials use; plugging process; solder resist; substrate fabrication; Assembly; Electrical resistance measurement; Laminates; Packaging; Plugs; Resins; Resists; Robustness; Substrates; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality Electronic Design, 2009. ASQED 2009. 1st Asia Symposium on
Conference_Location
Kuala Lumpur
Print_ISBN
978-1-4244-4952-1
Electronic_ISBN
978-1-4244-4952-1
Type
conf
DOI
10.1109/ASQED.2009.5206269
Filename
5206269
Link To Document